Identification of Defects in Semiconductors (Semiconductors and Semimetals)


This volume is aimed at the graduate student or working researcher who needs a broad overview andan introduction to current liter This volume reviews the latest understanding of the behavior and roles of oxygen in silicon, which will carry the field into the ULSI era from the experimental and theoretical points of view.

The fourteen chapters, written by recognized authoritie Defects in ion-implanted semiconductors are important and will likely gain increased importance in the future as annealing temperatures are reduced with successive IC generations.

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Novel implant approaches, such as MdV implantation, create new type Defects in ion-implanted semiconductors are important and will likely gain increased importance as annealing temperatures are reduced with successive IC generations. Novel implant approaches, such as MdV implantation, create new types of defects w This is the first book to describe an emerging but already growing technology of thermal imaging based on uncooled infrared imaging arrays and systems, which are the most exciting new developments in infrared technology today.

This technology is o Volume 48in the Semiconductors and Semimetals series discusses the physics and chemistry of electronic materials, a subject of growing practical importance in the semiconductor devices industry.

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The contributors discuss the current state of knowle This volume addresses the subject of materials science, specifically the materials aspects, device applications, and fabricating technology of SiC. Related Video Shorts 0 Upload your video.

Identification of Defects in Semiconductors

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Product details

Read the latest chapters of Semiconductors and Semimetals at ScienceDirect. com, Elsevier's leading platform of peer-reviewed scholarly literature. Purchase Identification of Defects in Semiconductors, Volume 51A - 1st Edition. Print Book View all volumes in this series: Semiconductors and Semimetals.

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Editorial Reviews

Methods of Experimental Physics: Books - Identification of Defects in Semiconductors, edited by M. Academic Press; 1 edition June 9, Language: View or edit your browsing history. Birefringent Thin Films and Polarizing Elements Birefringent skinny motion pictures and Polarizing parts 2nd version comprises the numerous advances which have been made because the first publication on tilted-columnar motion pictures used to be released. Defects in semiconductors support to provide an explanation for numerous phenomena, from diffusion to getter, and to attract theories on fabrics' habit according to electric or mechanical fields. Reflecting the truly interdisciplinary nature of the field that the series covers, the volumes in Semiconductors and Semimetals have been and will continue to be of great interest to physicists, chemists, materials scientists, and device engineers in modern industry.

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